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Alternative TitleAccurate Parameter Measurement of Wave Plate Based on the Dual-Beam Polarization Analyzer Configuration
彭建国1,2; 袁沭1; 金振宇1; 季凯帆1
Source Publication光学学报 (Acta Optica Sinica)
Contribution Rank第1完成单位
Indexed ByEI ; 核心
Keyword测量 波片 延迟量 双光束检偏 非线性响应


Other Abstract

A wave plate is commonly used for polarization measurement and polarization calibration of a large solar telescope. In this study, we developed a measurement system based on the dual-beam polariztion analyzer configuration to measure the phase retardance and azimuth angle of the wave plate, and derived the corresponding mathemantical model. The influence of azimuth error of the polarizerin the single bema measurement system was overcome by fitting the azimuth of the polarizer. At the same time, we analyzed the retardance range of the measuring plate, and accurately measured the wave plate used in polarization calibration and polarication measurement. Finally, we analyzed the main error sources of the system, including the power noise of the light soucec, position error of the rotating stage, and nonlinear response of the detector. Sunbsequently, we corrected the detector/s nonlinear response after calibration. The measurement errors of phase retardance and azimuth angle are within 0.02 for a quater-wave plate and a wave plate with pase retardaces of 127. The retardance and azimuth errors are leass than 0.05 for the wave plates with phase retardances of 27-145 and 215-333.

Funding Project国家自然科学基金[11833010] ; 国家自然科学基金[11773069] ; 国家自然科学基金[11873091] ; 云南省基础研究计划重点项目[2019FA001]
Funding Organization国家自然科学基金[11833010, 11773069,11873091] ; 云南省基础研究计划重点项目[2019FA001]
Subject Area物理学 ; 光学 ; 天文学 ; 天文学其他学科
MOST Discipline Catalogue理学::天文学
SubtypeJournal article (JA)
PublisherChinese Optical Society
EI Accession Number20202708884123
EI KeywordsOptical devices
EI Classification Number741.1 Light/Optics - 741.3 Optical Devices and Systems - 941.3 Optical Instruments
Citation statistics
Document Type期刊论文
Corresponding Author袁沭
Affiliation1.中国科学院云南天文台, 云南, 昆明, 650216
2.中国科学院大学, 北京, 100049
First Author AffilicationYunnan Observatories, Chinese Academy of Sciences
Corresponding Author AffilicationYunnan Observatories, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
彭建国,袁沭,金振宇,等. 基于双光束检偏的波片测量系统[J]. 光学学报 (Acta Optica Sinica),2020,40(9):70-78.
APA 彭建国,袁沭,金振宇,&季凯帆.(2020).基于双光束检偏的波片测量系统.光学学报 (Acta Optica Sinica),40(9),70-78.
MLA 彭建国,et al."基于双光束检偏的波片测量系统".光学学报 (Acta Optica Sinica) 40.9(2020):70-78.
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